Authors
Peter Sheridan Dodds, Vermont Advanced Computing Core
Eric M. Clark, Vermont Advanced Computing Core
Suma Desu, Massachusetts Institute of Technology
Morgan R. Frank, Massachusetts Institute of Technology
Andrew J. Reagan, Vermont Advanced Computing Core
Jake Ryland Williams, Vermont Advanced Computing Core
Lewis Mitchell, The University of Adelaide
Kameron Decker Harris, University of Washington, Seattle
Isabel M. Kloumann, Cornell University
James P. Bagrow, Vermont Advanced Computing Core
Karine Megerdoomian, MITRE Corporation
Matthew T. McMahon, MITRE Corporation
Brian F. Tivnan, University of Vermont
Christopher M. Danforth, Vermont Advanced Computing Core
Document Type
Letter to the Editor
Publication Date
6-9-2015
Recommended Citation
Dodds PS, Clark EM, Desu S, Frank MR, Reagan AJ, Williams JR, Mitchell L, Harris KD, Kloumann IM, Bagrow JP, Megerdoomian K. Reply to Garcia et al.: Common mistakes in measuring frequency-dependent word characteristics. Proceedings of the National Academy of Sciences. 2015 Jun 9;112(23):E2984-5.
DOI
10.1073/pnas.1505647112
