Automation in IC Test Measurements
McNeil, Ruairidh
McNeil, Ruairidh
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Abstract
Integrated circuit testing and test measurements are extremely important in the process of IC circuit design and production. In the abstract, performing highly accurate test procedures at high throughput. With highly variable chip architectures being tested in UVM’s lab, test automation is crucial in gathering significant data quickly. The objective of test automation is to gather IC measurement data efficiently and flexibly without user interaction. In industry, high throughput test procedures help to build reliable and highly accurate models that help their designers develop better IC’s.
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Date
2024-01-01
Student Status
Undergraduate
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Poster Presentation
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Program/Major
Electrical Engineering
College/School
College of Engineering and Mathematical Sciences
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Engineering and Math Science