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Mapping lithium diffusion in thin-film V2O5 using raman spectroscopy

MacAyeal, Daniel
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Understanding lateral diffusion of lithium in thin-film solid state battery (SSB) materials is critical to improving SSB performance, stability, lifespan, and architecture. Using model test structures of sputtered V2O5/W/LiPON, we use Raman spectroscopy peak shifts to map Lithium concentration in V2O5. We evaluate the diffusion of lithium from LiPON layers into thin-film V2O5, measure the impact of different sputter deposition process conditions on lateral lithium diffusion. Lastly, we will discuss the important implications of the lateral spacing limitations of clustered SSB devices due to lateral diffusion and propose architectural design rules based on this diffusion behavior for optimized device performance.
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Graduate
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2025-05-29
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UVM Student Research Conference
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https://hdl.handle.net/20.500.14849/9040
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