Characterizing charge carrier dynamics in solid-state electrolytes using hall measurements
Abstract
To identify charge carrier type and transport properties in thin-film solidstate electrolyte and semiconductor materials, a custom Hall measurement system is used to optimize precision and sensitivity. The setup integrates a DMA electromagnet, Keithley 2400 sourcemeter, and Agilent voltmeter, controlled through a GUI that automates data collection and analysis. Using the Van der Pauw technique, I measure Hall voltage, conductivity, and carrier concentration across various configurations. Micro-scale Hall electrodes are also being designed to enable high-resolution testing of future materials deposited via atomic layer deposition (ALD), supporting studies of emerging materials with low mobilities in next-generation solid-state devices.
Primary Faculty Mentor Name
Alexander Kozen
Status
Undergraduate
Student College
College of Engineering and Mathematical Sciences
Program/Major
Physics
Primary Research Category
Physical Science
Characterizing charge carrier dynamics in solid-state electrolytes using hall measurements
To identify charge carrier type and transport properties in thin-film solidstate electrolyte and semiconductor materials, a custom Hall measurement system is used to optimize precision and sensitivity. The setup integrates a DMA electromagnet, Keithley 2400 sourcemeter, and Agilent voltmeter, controlled through a GUI that automates data collection and analysis. Using the Van der Pauw technique, I measure Hall voltage, conductivity, and carrier concentration across various configurations. Micro-scale Hall electrodes are also being designed to enable high-resolution testing of future materials deposited via atomic layer deposition (ALD), supporting studies of emerging materials with low mobilities in next-generation solid-state devices.
