Automatic Data Collection and Simulation of P-N Junctions

Presenter's Name(s)

Thomas Brewer
Thomas Sykes

Conference Year

2024

Abstract

This project explores the simulation and analysis of P-N junctions, an important building block for semiconductor devices. To generate these simulations, experimental data was first collected using a switching matrix and parameter analyzer. This process was automated for easy replication across different devices. This project focused on measuring current-voltage characteristics and junction capacitance. IC-CAP modeling software was used for analysis and model generation. These models provide valuable information about device parameters and the physics of P-N junctions.

Primary Faculty Mentor Name

Jackson Anderson

Status

Undergraduate

Student College

College of Engineering and Mathematical Sciences

Program/Major

Electrical Engineering

Primary Research Category

Engineering and Math Science

Abstract only.

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Automatic Data Collection and Simulation of P-N Junctions

This project explores the simulation and analysis of P-N junctions, an important building block for semiconductor devices. To generate these simulations, experimental data was first collected using a switching matrix and parameter analyzer. This process was automated for easy replication across different devices. This project focused on measuring current-voltage characteristics and junction capacitance. IC-CAP modeling software was used for analysis and model generation. These models provide valuable information about device parameters and the physics of P-N junctions.