Automation in IC Test Measurements
Conference Year
2024
Abstract
Integrated circuit testing and test measurements are extremely important in the process of IC circuit design and production. In the abstract, performing highly accurate test procedures at high throughput. With highly variable chip architectures being tested in UVM’s lab, test automation is crucial in gathering significant data quickly. The objective of test automation is to gather IC measurement data efficiently and flexibly without user interaction. In industry, high throughput test procedures help to build reliable and highly accurate models that help their designers develop better IC’s.
Primary Faculty Mentor Name
Jackson Anderson
Status
Undergraduate
Student College
College of Engineering and Mathematical Sciences
Program/Major
Electrical Engineering
Primary Research Category
Engineering and Math Science
Automation in IC Test Measurements
Integrated circuit testing and test measurements are extremely important in the process of IC circuit design and production. In the abstract, performing highly accurate test procedures at high throughput. With highly variable chip architectures being tested in UVM’s lab, test automation is crucial in gathering significant data quickly. The objective of test automation is to gather IC measurement data efficiently and flexibly without user interaction. In industry, high throughput test procedures help to build reliable and highly accurate models that help their designers develop better IC’s.